The PST6747A Semiconductor Test and analysis system is a special instrument for measuring and analyzing the static parameters of power semiconductor devices, providing static parameter measurement solutions for all types of power semiconductor devices. Product configuration High-accuracy, wide range, high-power SMU, support mainstream power devices, power modules and wide band gap semiconductors (SiC, GaN) for IV/CV/RG/QG parameter testing, to meet the domestic semiconductor industry research and development, testing analysis and other testing needs. Support 3kV(can be expanded to 10kV) and 2200A conditions to achieve accurate measurement, analysis of power semiconductor device static parameters, support to connect the heat hood, temperature box for high and low temperature testing; Support connected probe station for wafer testing; Equipped with SMU board card resource module, single module has two functions of measurement and source; Main test parameters: Current resolution fA level. Test objects cover: Meet the static parameters of Si devices such as IGBT/DIODE/MOSFET and new materials (GaN and SiC) devices (VTH+ICES/IDSS+IGES/IGSS+VCEsat+RDSON+VDSON+V(BR)) CE+VF/VSD, etc.)CISS+COSS+CRSS curve test requirements. The product is mainly used in the direction of universities and institutes for power teaching utensils, teaching utensils of scientific research units, customizable experiment platform and teaching utensils. At the same time to meet the power device application units and third-party detection platforms to provide customized functions on the basis of this device.