Test & Measurement-2024 World Electronics Achievement Awards-EE Times

Product：Spectrum Analyzer VSA01

Recommended reasons： Main features: ● Frequencies up to 50GHz ● Analysis bandwidth: Maximum 2GHz, with 160MHz, 200MHz, 500MHz, 1GHz, 2GHz bandwidth optional ● Real-time analysis bandwidth: maximum 1GHz, POI < 2us, effectively support real-time analysis of broadband signals and FH signal capture in complex scenarios ● Storage depth: provides a maximum of 10TByte internal collection storage depth, effectively supporting users' long-term signal collection storage requirements ● Background noise: -166 dBm/ Hz@1GHz (typical value of open preamplifier) ● Phase noise:

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Rohde & Schwarz

Product：Sub-terahertz ultra wide-band vector signal generation solution

Recommended reasons： The new launched R&S SFI100A wideband IF vector signal generator is developed to meet high bandwidth needs for demanding applications, such as early 6G research, high capacity wireless backhaul, fixed wireless access, sensing and automotive radar. This instrument is with up to 10 GHz RF modulation bandwidth and 8 GSa memory depth, and can generate IF signal up to 21 GHz. The R&S SFI100A connects seamlessly with up-conversion frontend R&S FE110ST(70 to 110 GHz) or FE170ST(110 to 175 GHz), allow the solution to act as a single instrument and generate ultra-wide bandwidth signals in the frequency range of 70 to 175 GHz. The unique advantages of this solution including 1) Excellent signal performance over a wide dynamic range, gives confidence to test the real performance of the DUT with enough margin. 2) Fully calibrated, once connected the correction data in the frontend automatically transfers to SFI100A, ensuring a fully calibrated signal generation and eliminating external calibration. 3) All controls are done on the SFI100A, operation becomes more convenient. 4) FE110ST or FE170ST has internal low phase noise LO oscillator, eliminating the need for an external analog signal generator. 5) Smart accessories such as bandpass filters and transmit power amplifiers integrated with EEPROM, automatic correction data transfer ensures accurate level output and frequency response performance.

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Tektronix

Product：MSO 4 Series B

Recommended reasons： Designed for embedded product designers who require high accuracy, versatility and ease of use, the Tektronix 4 Series B MSOs feature 200MHz to 1.5GHz bandwidth, hardware 12-bit ADCs, 16-bit vertical resolution in high-resolution mode and a real-time sampling rate of 6.25GS/s, and the same excellent signal fidelity as previous versions of the 4 Series. 4 Series B MSOs also feature up to six input channels, ideal for performing three-phase power analysis, and a unique Spectrum View feature that enables multi-channel spectrum analysis synchronised with time-domain waveforms. With up to six input channels, it is ideally suited for performing three-phase power analysis, and its unique Spectrum View feature enables multichannel spectrum analysis synchronised with time-domain waveforms. 4 Series B MSOs are also equipped with a 13.3-inch (1920x1080) high-definition display with industry-leading optical bonding technology for greater screen contrast and viewing angle. 4 Series B MSOs feature 12-bit analogue-to-digital converter and high sampling rates to capture a wide range of signal details in depth. With more than 25 serial decoding packages, the 4 Series B MSOs are able to dramatically reduce response times for a variety of applications such as inter-chip, automotive, power, aerospace bus, and more.

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Fluke

Product：Fluke 283FC True-RMS CAT III 1500 V Solar/Power Electronics Digital Multimeter and Wireless Current Clamp

Recommended reasons： Unlock Safety, Accuracy, and Efficiency: Designed for Solar/Power Electronics, Ready for Anything The CAT III 1500 V / CAT IV 1000 V True-rms Fluke 283 FC Digital Multimeter and a283 FC True-rms Wireless Current Clamp set the new standard for technicians in DC environments up to 1500 V. Whether you’re working with a utility-scale solar photovoltaic (PV) array, wind power, electric railways, or data centers, the Fluke 283 FC has been engineered to enhance safety and increase productivity while giving you accurate, reliable, and repeatable results. The 283 FC/PV includes CAT III 1500 V DC safety-rated accessories so you can work confidently in higher voltage environments without compromising safety. Staubli MC4 test leads allow you to quickly make reliable, secure connections to modules or strings to test DC voltage up to 1500 V DC. TL175-HV CAT III 1500 V / CAT IV 1000 V rated silicone test leads give you more flexibility when testing voltage, millivoltage, resistance, continuity, or capacitance on inverters, combiner boxes, PV arrays, or individual PV modules. A bright backlit LCD screen and illumined keypad make it easier to work in both direct and low light conditions. The included magnetic hanging kit frees up your hands and the custom hard carrying case protects your investment while you transport it.

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Keysight Technologies

Product：N5186A MXG vector signal generator

Recommended reasons： The N5186A MXG offers the following benefits: • Compact design – Delivers multichannel capabilities in a 2U size that saves up to 75% of rack height. • High-performance capabilities – Employs direct digital synthesis (DDS) digital-to-analog converter (DAC) proprietary technology for bandwidth coverage up to 960 MHz with best-in-class error vector magnitude (EVM) and adjacent channel power ratio (ACPR) performance for lower signal distortion. • Testing convenience – Features an embedded reflectometer delivering accurate signals while enabling faster time-to-test and simplifying test setups. • Exceptionally low phase noise – Produces pure signals enabling high resolution radar system designs and high-throughput, next-generation communications systems.

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Keysight Technologies

Product：E7515W UXM 5G Wireless Test Platform

Recommended reasons： The E7515W solution can simulates Wi-Fi devices and traffic to cover new use cases from the latest IEEE 802.11be standards, it also enables faster test setups with less complexity and delivers better load and bandwidth performance to help Wi-Fi 7 device makers accelerate time to market. • Built on proven Keysight metrology: Expands the market leading UXM 5G Network Emulation Solution to simulate Wi-Fi devices and traffic to cover new use cases on the latest IEEE 802.11be standards. • Wi-Fi 7 scale: Emulates hundreds of clients at once – three-times more than existing solutions in the market – with traffic simulation without the need for additional equipment. • Wi-Fi 7 throughput: Supports Wi-Fi 7 4x4 MIMO 320 MHz bandwidth and performs Wi-Fi 7 signaling RF and throughput testing on clients and APs, including the latest 802.11 variants. • Deeper insights: Uses analysis software to provide PHY / MAC-level information such as rate versus range, enhanced Rx sensitivity, radio unit (RU) sweep analysis, and full-rate throughput to generate relevant Wi-Fi signaling and RF throughput results. • Integrated, turnkey platform: Tests more complex devices with 5G and LTE capabilities Wi-Fi / cellular interworking validation as well as integrated fixed wireless access (FWA) testing for the fast-growing customer premises equipment (CPE) market. • Simplified testing: Offers inherent synchronization, better repeatability, reduced time spent on cabling and test setup, higher automation, and faster debugging and reporting.

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RIGOL TECHNOLOGIES CO., LTD.

Product：DG800 Pro Series Function / Arbitrary Waveform Generator

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RIGOL TECHNOLOGIES CO., LTD.

Product：DHO800 Series Digital Oscilloscope

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Smiths Interconnect

Product：DaVinci 112 high speed test socket

Recommended reasons： Smiths Interconnect announced the expansion of its DaVinci Series to incorporate DaVinci 112 - ideal for testing the most complex functionality of Application Specific Integrated Circuits (‘ASICs’). With DaVinci 112, Smiths Interconnect has achieved a full coverage of product line for high speed test of 0.35mm pitch and above. Historically Cloud, Data Centre, Artificial Intelligence and Connected Automotive segments have all used CPUs or GPUs that were intended for other applications. As the performance, functionality and size of the chips for these end-use applications continue to increase, now companies are designing and manufacturing Application Specific Integrated Circuits intended solely for the end segment. Addressing high speed signaling, device complexity and power requirements, the pin count is well over 4000 I/O’s all working in tandem to meet the specification. At the same time, testing these devices in full functionality is difficult due to noise isolation. DaVinci 112 test socket change in mechanical structure ensures the ground probe is always in contact with the socket body. This improved ground path offers a cleaner power delivery and is a significant feature to isolate pin-to-pin cross-talk, with 50% improvement of the cross-talk isolation over DaVinci 56 test socket. DaVinci 112 test socket increases production yields and throughput, eliminating false faults and complete functional failures. As a result, it has significantly improved our client’s chip test yields and overall test throughput while saving test costs.

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Bontec Raysemi Semiconductor Technology (Suzhou) Co., Ltd

Product：Semiconductor Testing and Analysis System

Recommended reasons： The PST6747A Semiconductor Test and analysis system is a special instrument for measuring and analyzing the static parameters of power semiconductor devices, providing static parameter measurement solutions for all types of power semiconductor devices. Product configuration High-accuracy, wide range, high-power SMU, support mainstream power devices, power modules and wide band gap semiconductors (SiC, GaN) for IV/CV/RG/QG parameter testing, to meet the domestic semiconductor industry research and development, testing analysis and other testing needs. Support 3kV(can be expanded to 10kV) and 2200A conditions to achieve accurate measurement, analysis of power semiconductor device static parameters, support to connect the heat hood, temperature box for high and low temperature testing; Support connected probe station for wafer testing; Equipped with SMU board card resource module, single module has two functions of measurement and source; Main test parameters: Current resolution fA level. Test objects cover: Meet the static parameters of Si devices such as IGBT/DIODE/MOSFET and new materials (GaN and SiC) devices (VTH+ICES/IDSS+IGES/IGSS+VCEsat+RDSON+VDSON+V(BR)) CE+VF/VSD, etc.)CISS+COSS+CRSS curve test requirements. The product is mainly used in the direction of universities and institutes for power teaching utensils, teaching utensils of scientific research units, customizable experiment platform and teaching utensils. At the same time to meet the power device application units and third-party detection platforms to provide customized functions on the basis of this device.

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